X-ray imaging of an industrial microcontroller sample using dual-energy technique

Abstract In a conventional single-energy X-ray imaging technique, the information obtained from examined object are often not sufficient for precise characterization. Hence, this study was designed to assess whether dual-energy technique would be good alternative method and can used improve output image. An electronic microcontroller chosen as sample due its complex inner structure. It scanned using micro computed tomography (micro-CT) scanner at two different energy levels: 60kVp 100kVp. Dual-energy image processing applied acquired results were compared in term of contrast quality. The combined scan 100kVp able visualize sample’s internal structure (raised surface). By comparison, only capable producing shadow resolution image, however, much lower loss data….